Current and voltage excitations for the eddy current model

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Voltage and Current Excitation for Time-Harmonic Eddy-Current Problems

We want to give a systematic presentation of voltage or current intensity excitation for time-harmonic eddy-current problems. The key point of our approach resides in a suitable power law, that permits to understand the role of voltage excitation. We also enlighten the influence of the boundary conditions on the proposed formulations.

متن کامل

Eddy current

Eddy currents (also called Foucault currents[1]) are loops of electrical current induced within conductors by a changing magnetic field in the conductor, due to Faraday’s law of induction. Eddy currents flow in closed loops within conductors, in planes perpendicular to the magnetic field. They can be induced within nearby stationary conductors by a time-varying magnetic field created by anAC el...

متن کامل

Hybrid Model for Bulk Current Injection Probe

A new hybrid-model for BCI probe is derived . This model is built based on the probe's internal structure without refinements, and by carrying out just one electrical measurement for the reflection coefficient, so that it can be generalized and used in studying the effect of layout parameters in the aim of improving the probe high frequency performance, which helps the developer in design stage...

متن کامل

Application of Lorentz force eddy current testing and eddy current testing on moving nonmagnetic conductors

Lorentz force eddy current testing is a novel nondestructive testing technique which can be applied preferably to the identification of internal defects in non-ferromagnetic moving conductors. This paper describes the comparison of this new technique with well-known eddy current testing. Measurements and numerical simulations have been done for both techniques for artificial subsurface defects ...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: International Journal of Numerical Modelling: Electronic Networks, Devices and Fields

سال: 2004

ISSN: 0894-3370,1099-1204

DOI: 10.1002/jnm.555